The CMS examination is designed to address the key focus areas in approximately the following ratios:
Examination Matrix for Level-1 Certification for 3D Metrology
|
Knowledge Areas Assessed in Certification Examination
|
% of Exam |
|
1. Interpret Design Documents and Requirements
- Interpret Blueprints
- Interpret CAD
- Interpret GD&T
- Convert units of measure
- Reference appropriate standards
- Determine accuracy and resolution
|
16% |
|
2. Measurement Device Knowledge
- Evaluate environmental conditions
- Evaluate size requirements / volume parameters
- Evaluate required accuracy of resolution
- Identify appropriate accessories (adapters, etc.)
- Identify ergonomic issues
- Evaluate material constraints
- Evaluate time constraints
- Evaluate accessibility
- Demonstrate knowledge of types/applications of common metrology equipment
|
16% |
|
3. Pre-measurement Planning
- Determine error budget
- Optimize equipment stations (including fixturing)
- Determine data collection/sampling
- Plan reference system
- Determine order of measurement
- Estimate data collection time
- Determine naming conventions
- Identify safety requirements
- Plan coordinate systems
- Plan traceability and documentation
- Create a documentation plan
- Develop a mitigation plan for environmental factors
- Plan subject temperature compensation strategy
- Maintain equipment
|
23% |
|
4. Performing Measurement Operations
- Verify calibration status
- Setup equipment (including fixturing)
- Install reference features
- Perform in-situ equipment check
- Determine and mitigate environmental influence on instrument
- Measure reference features to create a coordinate system
- Measure features of interest
- Re-check reference features
- Manage temperature influence on part (scale)
- Perform device move if required
- Perform quality assurance of data set
- Manage measurement data
- Establish traceability
|
25% |
|
5. Analyzing Data and Ethics
- Compare measurement data to design specifications
- Evaluate GD&T
- Combine and evaluate alignment of multiple data sets
- Register data sets to known reference system
- Optimize data
- Construct geometry
- Calculate uncertainty and its impact on measurement task
- Describe statistical process control (SPC)
|
20% |
Last updated: June 13, 2013