The CMS examination is designed to address the key focus areas in approximately the following ratios:

 Examination Matrix for Level-1 Certification for 3D Metrology

Knowledge Areas Assessed in Certification Examination

% of Exam
1. Interpret Design Documents and Requirements

  • Interpret Blueprints
  • Interpret CAD
  • Interpret GD&T
  • Convert units of measure
  • Reference appropriate standards
  • Determine accuracy and resolution
2. Measurement Device Knowledge

  • Evaluate environmental conditions
  • Evaluate size requirements / volume parameters
  • Evaluate required accuracy of resolution
  • Identify appropriate accessories (adapters etc.)
  • Identify ergonomic issues
  • Evaluate material constraints
  • Evaluate time constraints
  • Evaluate accessibility
  • Demonstrate knowledge of types/applications of common metrology equipment
3. Pre-measurement Planning

  • Determine error budget
  • Optimize equipment stations (including fixturing)
  • Determine data collection/sampling
  • Plan reference system
  • Determine order of measurement
  • Estimate data collection time
  • Determine naming conventions
  • Identify safety requirements
  • Plan coordinate systems
  • Plan traceability and documentation
  • Create a documentation plan
  • Develop a mitigation plan for environmental factors
  • Plan subject temperature compensation strategy
  • Maintain equipment
4. Performing Measurement Operations

  • Verify calibration status
  • Setup equipment (including fixturing)
  • Install reference features
  • Perform in-situ equipment check
  • Determine and mitigate environmental influence on instrument
  • Measure reference features to create a coordinate system
  • Measure features of interest
  • Re-check reference features
  • Manage temperature influence on part (scale)
  • Perform device move if required
  • Perform quality assurance of data set
  • Manage measurement data
  • Establish traceability
5. Analyzing Data and Ethics

  • Compare measurement data to design specifications
  • Evaluate GD&T
  • Combine and evaluate alignment of multiple data sets
  • Register data sets to known reference system
  • Optimize data
  • Construct geometry
  • Calculate uncertainty and its impact on measurement task
  • Describe statistical process control (SPC)



Last updated: June 13 2013